New EPMA-XRF Integration Allows Rapid Trace Element Analysis of Geological Materials
نویسندگان
چکیده
منابع مشابه
A New EPMA Method For Fast Trace Element Analysis In Simple Matrices
Traditionally Electron Probe Micro Analysis (EPMA) has relied upon precise characterization of the continuum intensities adjacent to the emission line of interest using Wavelength Dispersive Spectrometry (WDS) for determination of the background under the peak. Recent improvements including new hardware designs with large area Bragg crystals, new software methods implementing exponential and po...
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International reference materials representing a diverse suite of sulfide ores and related lithologies have been analyzed for major and trace element concentrations by XRF, solution ICP–MS, and laser-ablation ICP–MS (LA–ICP–MS) after fusion of the sample to a lithium borate glass. Reference materials analyzed for this study include a wide variety of bulk compositions, including ores of Pb–Zn su...
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The chief product of an analytical laboratory quality assurance (QA) program, ultimately, is confidenceconfidence that the analysis of any specimen sent to any laboratory participating in the program will be consistent, correct within tolerance, and interchangeable with equivalent analyses of related specimens performed by any other laboratory in the program. In order to maximize confidence, t...
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Natural rocks composing the Earth are complex. They consist of an aggregate of one or more minerals. Each mineral can be defined by its chemical composition and its crystalline structure and sometimes can also contain fluid inclusions. Geologists need a powerful characterization technique to get detailed information on the rock formation history. Raman spectroscopy is extremely information-rich...
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ژورنال
عنوان ژورنال: Microscopy and Microanalysis
سال: 2020
ISSN: 1431-9276,1435-8115
DOI: 10.1017/s1431927620019698